Proposal for Semiconductor Inspection (Wafer Test) Services
We provide support from reliability testing to failure analysis reports!
Rinjin Tech provides semiconductor inspection (wafer testing) services. As part of quality control for automotive products, we offer technologies such as OST (Outliers Screening Test) to detect outlier chips from wafer test results and classify them as defective, in order to further improve the quality of good chips. Additionally, we have services for electrostatic management, earthquake countermeasures, and reliability testing. 【Wafer Testing Technologies】 ■PAT (Part Average Testing) - Purpose: To calculate the distribution of measurement values for individual test items and classify chips with data that deviates from the main distribution as defective. ■GAT (Geometric Analysis Testing) - Purpose: To detect chips that deviate from the good product distribution based on the positional distribution on the wafer from the map data of test results and classify them as defective. *For more details, please refer to the PDF document or feel free to contact us.
- Company：菱進テック
- Price：Other
